National Physical Laboratory

Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy 

NPL has three electron microscopes available for image analysis and elemental analysis.

SEM imaging can be utilised for looking at surfaces with complex topography with a magnification vastly in excess of that possible with optical microscopes (over x 100,000).

Common applications:

  • High magnification imaging
  • Locating tin whiskers
  • Examining intermetallic layers
  • Investigating crack failure modes
  • General failure analysis


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Last Updated: 2 Apr 2012
Created: 29 Jul 2009


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