NPL has three electron microscopes available for image analysis and elemental analysis.

SEM imaging can be utilised for looking at surfaces with complex topography with a magnification vastly in excess of that possible with optical microscopes (over x 100,000).

Common applications:

• High magnification imaging
• Locating tin whiskers
• Examining intermetallic layers
• Investigating crack failure modes
• General failure analysis

Contact

Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk