National Physical Laboratory

Scanning Acoustic Microscopy (SAM)

Scanning Acoustic Microscopy

The NPL EI Group has a SONIX Scanning Acoustic Microscope.

Scanning Acoustic Microscopy (SAM) is a technique for studying buried solid interfaces of dissimilar materials.

The technique uses ultrasonic waves reflecting or transmitting at material interfaces. Features such as bonded interfaces, delaminated interface, voids and cracks can be detected non-destructively.

Common applications:

  • Detection of voids and cracks in die and moulding compounds
  • Plastic, ceramic, BGA and Flip Chip IC package analysis
  • Evaluations of die attach integrity
  • Assessing integrity of seals and bonding for shielding or hermetic cases


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Last Updated: 6 Aug 2015
Created: 30 Jul 2009


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