NPL has three electron microscopes available for image analysis and elemental analysis.

An electron microscopic technique, 'Energy Dispersive X-ray Spectra' (EDX), allows the elements present, and their amount, to be determined.

The technique can be used effectively with sectioning to add to knowledge gained from visual examination of sectioned samples.

Elemental digimaps can be produced which show the location of elements over a given area.

Common applications:

• The origin of contaminants and residues
• The composition of phase in alloys
• The composition of dendrites, CAF filaments and intermetallics

Contact

Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk