NPL provides services for the characterisation of the form and texture of micro or nano-scale surface features using our extensive range of facilities. NPL designed instruments, such as the Areal Instrument (for three-dimensional surface parameters), Metrological Atomic Force Microscope (MAFM) and NanoSurf IV, provide the highest level of accuracy and direct traceability to the metre. In addition to these unique capabilities, an extensive range of commercial instruments, including a stylus instruments and non-contacting instruments (scanning white light interferometer, variable focus and confocal microscopes), are available.

Links

• Surface Topography and Nano-Metrology Measurements
• Surface Texture Calibration Standards
• Metrological Atomic Force Microscope

Contact

Customer Service tel: +44 20 8943 8631
E-mail: dimensional_enquiries@npl.co.uk