National Physical Laboratory

Linescale Standards

NPL photomask linewidth standards are designed for use in the microelectronics industry and can also be used in image analysing measurement systems, fibre sizing and for the measurement of micro-engineered components.

  • NPL photomask linewidth standards - (2 µm to 10 µm)
  • NPL photomask linewidth standards - (0.5 µm to 50 µm)
  • Linewidth calibrations
  • Calibration of SEM standards
Last Updated: 13 Sep 2016
Created: 5 Sep 2007

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