Recent advances in precision engineering, optics, electronics, materials technology and molecular biology have placed increasing demands on nanometrology - the measurement of dimensions or tolerances below 1 µm. To cater for this demand NPL is currently engaged in research to improve metrology at the nano metre level which builds on a number of instruments previously developed at NPL which were designed for measuring surface texture and form with traceability to the metre.

Over recent years several innovative new large-scale metrology products such as laser radar or indoor GPS, or advanced ways of employing metrology for example in complicated measurement networks have come to market. Whilst these new technologies are attractive to potential end-users there are concerns that standards and independent performance verification techniques and are not keeping up with technology. NPL has been working towards addressing these needs by developing hardware and software systems that together provide a traceable reference metrology framework on which to base performance evaluation technologies and to provide the highest accuracy co-ordinate measurement systems.