The direct measurement of piezoelectric displacement is a cornerstone of the work carried out at NPL, and can be conducted in using various different techniques.

JAMIN-based differential optical interferometry set-up

This an essential piece of experimental equipment which is employed in the measurement of the very small displacements often associated with piezoelectrically active materials. With this probe it is possible to resolve nano or sub-nano scale displacements, depending on the associated detection electronics.

A specialist vacuum grip chuck sample holder was developed by the group to enable high voltage field investigations to be carried out in safety.

Fibre Optic Probe Displacement Measurement System

This system employs a photonic sensor and enables displacement measurements to be made rapidly in awkward orientations not suitable for measurement using the optical interferometry technique above. Other advantages include the ease with which it can be prepared and calibrated.

Capacitance-based Displacement Measurements

This displacement measuring equipment makes use of the parallel plate capacitance measurement method - using a Queensgate series of capacitance gauge sensors.

In-House Scanning Imaging Displacement Measurement System

A specially developed point-to-point scanning system has recently been designed and built that facilitates the production of surface displacement maps for piezoelectric actuators operated under high applied field. It makes use of a triangulation laser diode, with the signal-to-noise ratio being enhanced through the use of lock-in amplifier techniques.

Contact

Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk