Accurate determination of surface topography can be determined using a triangulation (CCD laser displacement) method by scanning features with a single light beam.

A semiconductor laser beam is reflected off the target surface and passes through a receiver lens system. The beam is focused on a CCD sensing array.

Data is available as a three-dimensional matrix and processed using special algorithms to give characteristic feature dimensions. The accuracy of the height measurement is typically +/- 5µm.

NPL also has two types of confocal microscope, which complement each over a wide range of magnifications.

Common applications:

• Analysis of solder paste print quality
• Analysis of adhesive and globtop deposits
• Measurement of component lead planarity
• Measurement of solder resist or track thickness

Contact

Customer Service tel: +44 20 8943 8681
E-mail: materials_enquiries@npl.co.uk