Author(s):

Blunt, L*, Jiang, X*, Leach, R K, Harris, P M, Scott, P*

Source:

Proceedings 10th International Conference on Metrology and Properties of Engineering Surfaces, 4-7 July 2005, St Ettiane, France, 105-111

ISSN:

ISBN:

NPL Doc. Ref:

PDB: 3987

Document Type:

Conference paper

DOI:

Note: An asterisk after an author's name indicates a non-NPL author.

Abstract:

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