Piezoresponse force microscopy (PFM) is an invaluable tool for measuring the piezoresponse of functional materials at the nanoscale, allowing for high resolution measurements of the electromechanical coupling of thin films.

In this work we address the challenges facing quantification of PFM by developing standards both through in-house work and inter-laboratory comparisons.

An international network of collaborators has been established as part of a VAMAS framework in an effort to work towards establishing a standard for PFM.