Simulating photoconductive atomic-force microscopy (pc-AFM)
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Nanoscale optical techniques such as photoconductive atomic-force microscopy (Pc-AFM) are useful tools for probing nanoscale morphology and defects in organic thin films. However, the interpretation of the data can be difficult.
We have developed a simulation package that can be used to aid the interpretation of data and investigate the limitations of the method.
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