National Physical Laboratory


Further Information

Published: 8 August 2012

Author: K Mingard

Related: Advanced Materials

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The NPL Zeiss Auriga 60 focused ion beam scanning electron microscope (FIB-SEM) is a major facility for 3D microstructural characterisation of materials.

It is yielding new information, with nanometre resolution, on materials' structure, composition and crystallography, and on damage to their structures that can be caused during their manufacture and use. It also has full fabrication facilities.

Last Updated: 26 Mar 2014
Created: 8 Aug 2012


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