Magnetic Scanning Probe Calibration using Graphene Hall Sensor
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Magnetic force microscopy (MFM) offers a unique insight into the nanoscale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique.
Quantitative MFM measurements require meticulous calibration of the magnetic scanning probe stray field. We use epitaxial graphene Hall sensors to calibration the stray magnetic field using scanning gate microscopy and Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions.
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