National Physical Laboratory

Magnetic Scanning Probe Calibration using Graphene Hall Sensor

Further Information

Published: 12 June 2013

Authors: V. Panchal, Ó. Iglesias-Freire, A. Lartsev, R. Yakimova, A. Asenjo and O. Kazakov

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Magnetic force microscopy (MFM) offers a unique insight into the nanoscale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique.

Quantitative MFM measurements require meticulous calibration of the magnetic scanning probe stray field. We use epitaxial graphene Hall sensors to calibration the stray magnetic field using scanning gate microscopy and Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions.

We explore the growth of graphene on the Si-terminated face of SiC in contrast with the C-terminated one and present a complementary comparison of growth morphology, chemical composition and electronic properties using a range of scanning probe microscopy and photoelectron spectroscopy techniques.
Last Updated: 25 Mar 2014
Created: 29 Apr 2013


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