Residual stress measurement: XRD depth profiling using successive material removal.
- Author(s):
- Fry, A T
- Source:
- NPL Report MATC(MN)34, September 2002
- ISSN:
- 1473-2742
- ISBN:
- NPL Doc. Ref:
- PDB: 3237
- Document Type:
- NPL Report
- DOI:
Note: An asterisk after an author's name indicates a non-NPL author.
Abstract:
As part of a continuing effort to improve and refine residual stress measurement using XRD technique, NPL has recently completed a series of measurements on a nickel based superalloy, which had been homogeneously shot-peened. The purpose of these measurements was to investigate and illustrate how progressive material removal can significantly relax the stresses generated by peening.
Further Information
General information about NPL publications and details to contact the British Library for other published papers can be found on the NPL Publications Homepage.