Recent advances in traceable nanoscale dimension and force metrology in the UK.
- Author(s):
- Leach, R K, Chetwynd, D*, Blunt, L*, Haycocks, J, Harris, P M, Jackson, K, Oldfield, S, Reilly, S
- Source:
- ISMTII 2005 - 7th International Symposium Series on Measurement Technology and Intelligent Instruments., 6-8 September 2005, Huddersfield, UK, 12-23
- ISSN:
- ISBN:
- NPL Doc. Ref:
- PDB: 4053
- Document Type:
- Conference paper
- DOI:
Note: An asterisk after an author's name indicates a non-NPL author.
Abstract:
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