National Physical Laboratory

Recent advances in traceable nanoscale dimension and force metrology in the UK.

Author(s):
Leach, R K, Chetwynd, D*, Blunt, L*, Haycocks, J, Harris, P M, Jackson, K, Oldfield, S, Reilly, S
Source:
ISMTII 2005 - 7th International Symposium Series on Measurement Technology and Intelligent Instruments., 6-8 September 2005, Huddersfield, UK, 12-23
ISSN:
ISBN:
NPL Doc. Ref:
PDB: 4053
Document Type:
Conference paper
DOI:

Note: An asterisk after an author's name indicates a non-NPL author.

Abstract:

No abstract available

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