Microstructure mapping in high temperature compression testpieces - grain size metrology by electron back scatter diffraction.
- Author(s):
- Mingard, K P, Bennett, E G, Ive, A J, Roebuck, B
- Source:
- NPL Report DEPC-MN 037, January 2006
- ISSN:
- 1744-3911
- ISBN:
- NPL Doc. Ref:
- PDB: 4224
- Document Type:
- NPL Report
- DOI:
Note: An asterisk after an author's name indicates a non-NPL author.
Abstract:
No abstract available
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