Advances in traceable nanometrology at the National Physical Laboratory.
- Author(s):
- Leach, R K, Haycocks, J, Jackson, K, Lewis, A, Oldfield, S, Yacoot, A
- Source:
- Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University, 112-128
- ISSN:
- ISBN:
- NPL Doc. Ref:
- PDB: 2505
- Document Type:
- Conference paper
- DOI:
Note: An asterisk after an author's name indicates a non-NPL author.
Abstract:
Further Information
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