National Physical Laboratory

A study of factors that may influence the quality of residual stress measurements from X-ray diffraction.

Author(s):
Fry, A T
Source:
NPL Report DEPC-MN 023, September 2005
ISSN:
1744-3911
ISBN:
NPL Doc. Ref:
PDB: 4037
Document Type:
NPL Report
DOI:

Note: An asterisk after an author's name indicates a non-NPL author.

Abstract:

No abstract available

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