Current Interests

• Develop and maintain standards and facilities for X-ray photoelectron spectroscopy, Ultraviolet photoelectron spectroscopy, Auger electron spectroscopy and ellipsometry
• Development of preparation methods for surface analysis and electron microscopy of nanoparticles
• Development of procedures for X-ray photoelectron spectroscopy of nanoparticles

Biography

Steve has been with NPL since 1980 when he initially worked in the High Temperature Corrosion Section and with Scanning Electron Microscopes and X-ray Microanalysis. He received his HNC in Applied Physics from Kingston Polytechnic in 1985. He has been working in the Surface and Nano-Analysis team as a Higher Research Scientist since 1993 and his main role is to manage the X-ray Photoelectron Spectroscopy/Ultraviolet Photoelectron Spectroscopy/Auger and ellipsometry facilities.

Selected Publications

1. Angular accuracy and the comparison of two methods for determining the surface normal in a Kratos Axis Ultra X-ray photoelectron spectrometer
   M. P. Seah and S. J. Spencer
   Surface and Interface Analysis, 41 (12-13) pages 960-965 (2009)
2. XPS Topofactors: Determining Overlayer Thickness on Particles and Fibres
   A. Shard, J. Wang, S. Spencer
   Surface and Interface Analysis, 41, pages 541-548 (2009)
3. On the applicability of XPS for quantitative total organic and elemental carbon analysis of airborne particulate matter
   R. J. J. Gilham, S. J. Spencer, D. Butterfield, M. P. Seah, P. G. Quincey
   Atmospheric Environment, 42, pages 3888-3389 2008)
4. Repeatable intensity calibration of an X-ray photoelectron spectrometer
   M. P. Seah and S. J. Spencer
   Journal of Electron Spectroscopy and Related Phenomena, 151, pages 178-181 (2006)
5. Ultrathin SiO2 on Si, VII: Angular Accuracy in XPS and an Accurate Attenuation Length
   M. P. Seah and S. J. Spencer
   Surface and Interface Analysis, 37, pages 731-736 (2005)

Contact details

Email: steve.spencer@npl.co.uk
Tel: 020 8943 8748