National Physical Laboratory

Nick Ridler

Current interests

Nick Ridler

Nick Ridler is the Head of Electrical Science in the Engineering, Materials and Electrical Science Department at NPL. He is also a Non-Executive Director of LA Techniques Ltd (a UK SME based in Surbiton, Surrey) and a Director of n3m-labs (the joint NPL/University of Surrey 'Nonlinear Microwave Measurement and Modelling Laboratories'). His main area of interest is precision electromagnetic metrology in support of next-generation information and communications technologies, and high-frequency electronics applications. His current research include measurements at millimetre-wave and terahertz frequencies; nonlinear microwave network analysis; high-speed measurements on Printed Circuit Boards (PCBs); RF nanotechnology; and, evaluating uncertainty in measurements.


Nick is a Fellow of the IEEE (Institute of Electrical and Electronics Engineers), a Fellow of the IET (Institution of Engineering and Technology), and a Fellow of the IOP (Institute of Physics). He is a Visiting Professor at the University of Leeds (in the School of Electronic and Electrical Engineering); a Visiting Professor at the University of Surrey (in the Faculty of Engineering and Physical Sciences); and a Visiting Professor at the University of Liverpool (in the Department of Electrical Engineering and Electronics). He also holds a Fellowship in Nonlinear Measurements at the Advanced Technology Institute, University of Surrey.

Nick is an internationally-renowned expert in precision high-frequency electromagnetic measurements (from RF to terahertz frequencies), authoring or co-authoring over 200 publications in this field, and has over 30 years' experience working in industrial, government and academic research establishments. He has twice been the recipient of the IEE Measurement Prize (in 1995 and 2005) and holds nine Best Paper awards from international scientific conferences. He takes lead roles in several international activities in this area, including:

  • Chair – IEEE MTT-S AdCom Standards Coordinating Committee (SCC), 2009–present
  • Past President – ARFTG (IEEE Automatic RF Techniques Group) Board of Directors, 2003–2015
  • Emeritus Chair – IEEE MTT-S 'Microwave Measurements' Technical Committee (MTT-11), 2003–present
  • Emeritus Chair and Founder – IET 'RF & Microwave Technology' Technical & Professional Network; Chair, 2009–2015
  • Chair and Founder – IEEE-Standards Association: P1785 Standard Working Group, 'Waveguides for Millimeter and Submillimeter Wavelengths', 2008–present
  • IEC Representative – Joint Committee for Guides in Metrology (JCGM) 'Working Group on the Expression of Uncertainty in Measurement', 2015–present

Selected recent publications

  • An Active Interferometric Method for Extreme Impedance On-Wafer Device Measurements
    H Votsi, C Li, P H Aaen, N M Ridler
    IEEE Microwave and Wireless Components Letters, Vol 27, No 11, pp 1034–1036 (2017)
  • Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements
    M Naftaly, R G Clarke, D A Humphreys, N M Ridler
    Proceedings of the IEEE, Vol 105, No 6, pp 1151–1165 (2017)
  • 3-D printed 1.1 THz waveguides
    W J Otter, N M Ridler, H Yasukochi, K Soeda, K Konishi, J Yumoto, M Kuwata-Gonokami, S Lucyszyn
    IET Electronics Letters, Vol 53, No 7, pp 471-473 (2017)
  • Evaluating Residual Errors in Waveguide Network Analysers from Microwave to Submillimetre-wave Frequencies
    L Stant, P H Aaen, N M Ridler
    IET Microwaves, Antennas & Propagation, Vol 11, No 3, pp 324–329 (2017)
  • The 2017 Terahertz Science and Technology Roadmap
    46 co-authors
    J Phys D: Applied Physics, Vol 50, No 4, 043001 (49 pp) (2017)
  • Comparing Methods for Evaluating Measurement Uncertainty Given in the JCGM 'Evaluation of Measurement Data' Documents
    L T Stant, P H Aaen, N M Ridler
    Measurement, Vol 94, pp 847–851 (2016)
  • Evaluation of Cross-connected Waveguides as Transfer Standards of Transmission at High Millimetre-wave Frequencies
    N M Ridler, R G Clarke, H Huang, S Zinal
    Metrologia, Vol 53, No 4, pp 1069–1078 (2016)
  • Establishing Traceability to the International System of Units for Scattering Parameter Measurements from 750 GHz to 1.1 THz
    N M Ridler, R G Clarke
    IEEE Trans Terahertz Science & Technology, Vol 6, No 1, pp 2–11 (2016)

Contact details

E: nick
T: 020 8943 7116

Last Updated: 1 May 2018
Created: 13 Jun 2012


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