Martin Munz
Current Interests

- Developing and evaluating methods in scanning probe microscopy (SPM) for applications in nanotechnology and materials science
- Characterising nano-scale objects (such as nanoparticles, nanorods and nanowires) by SPM
- Developing the measurement technology for chemical sensing through nanowires, in collaboration with Surrey University
Biography
Martin obtained a Diploma in Physics from Saarland University in 1995, with a focus on solid state physics. In 1999 he earned a doctorate from the Technical University Berlin (TUB) for studies on the nanomechanical characterisation of interphases in reinforced polymers. From 2000 to 2005 he was with the Federal Institute of Materials Research and Testing (BAM) in Berlin, where he applied atomic force microscopy (AFM) and related techniques to the characterisation of surfaces and interfaces in polymers and polymer composites. In 2006 he joined the Surface and Nano-Analysis Group at NPL. For his PhD thesis, Martin was awarded the Kurt Überreiter Award 2000 from the Berlin-Brandenburg Association for Polymer Research. Over the semesters 2002/03, 2003/04 and 2004/05, he was lecturing on SPM (at the Institute for Materials Science and Technology, TUB). He is a member of the German Physical Society (DPG) and of the Institute of Physics (IoP).
Selected Publications
- Force calibration in lateral force microscopy - A review of the experimental methods
M. Munz
J. Phys. D: Appl. Phys., 43, page 34, 063001 (2010) - Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support
M. Munz, D. C. Cox, P. J. Cumpson
physica status solidi (a), 205, page 1424 (2008) - On the nature of the multi-zone interphase of a thermoset/thermoplastic composite - an analysis employing dynamic-mechanical thermal analysis and nanoindentation
M. Munz
J. Adh., 84, page 445 (2008) - Mapping epoxy interphases
M. Munz, J. Chung, G. Kalinka
Chapter 8: Adhesion - Current research and applications (ed. W Possart, Weinheim: Wiley-VCH, 2005) pp 103-123. ISBN 978-3-527-31263-4 - Materials contrasts and nanolithography techniques in scanning force microscopy (SFM) and their application to polymers and polymer composites
M. Munz, B. Cappella, H. Sturm, M. Geuss, E. Schulz
Adv. Polym. Sci., 164, page 87 (2003)
Full list of publications by Martin Munz
Contact details
Email: martin.munz@npl.co.uk
Tel: 020 8943 6926
