Current Interests

• Secondary Ion Mass Spectrometry (sputtering and molecular emission by cluster ion beams, organic depth profiling, 3D-SIMS, complex molecules at surfaces, novel cluster beams)
• Data interpretation and analysis (G-SIMS, molecular structure using G-SIMS Fragmentation Pathway Mapping and SMILES, Multivariate analysis, informatics)
• Imaging mass spectrometry
• Chemical characterisation of nanostructures using SIMS and other techniques
• Ambient surface mass spectrometry (DESI, PADI, EESI)
• Development of international standards in Surface Chemical Analysis

Biography

Ian is a National Physical Laboratory Fellow in Surface and Nanoanalysis and a Visiting Professor in the School of Pharmacy at the University of Nottingham. His research focus is on the analysis of complex molecules at surfaces and interfaces at different length scales. His research areas include secondary ion mass spectrometry where he has made important contributions to molecular identification through the innovation of a novel new variant of SIMS called G-SIMS, building the underpinning science for cluster ion beams, including the enhancement of molecular secondary ion yield and organic depth profiling, developing the measurement infrastructure to support Desorption Electrospray Ionisation (DESI) and related ambient mass spectrometries, advances in multivariate analytical methods to interpret data, and the analysis of nanoparticles and fibres. Ian is on the Board of Directors for the AVS, a major science and technology society in the USA. He is very active in the development of International Standards through ISO TC 201 (surface chemical analysis), leading pre-normative research through VAMAS interlaboratory studies (chair of TWA 2 Surface chemical analysis), and international traceability through key comparisons and pilot studies in CCQM. He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. He was awarded the Institute of Physics Paterson Medal (2004). He is a Fellow of the Institute of Physics and a Fellow of the AVS. Ian has authored and co-authored over 80 papers in surface analysis covering SIMS, AES and XPS. He is the secretariat of the International Committee for the SIMS conference series and is involved in international advisory boards for SIMS Europe, ECASIA, PSA (Asia-Pacific region) and AVS ASSD.

Selected Publications

1. Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions, J L S Lee, S Ninomiya, J Matsuo, I S Gilmore, M P Seah and A G Shard, Anal Chem 82 (2010) 98
2. The effect of electrospray solvent composition on desorption electrospray ionisation (DESI) efficiency, F M Green, T L Salter, I S Gilmore, P Stokes, G O'Connor, Analyst, 2010, DOI: 10.1039/b924208b
3. Multivariate Image Analysis Strategies for TOF-SIMS Images with Topography, J L S Lee, I S Gilmore, I W Fletcher, M P Seah, Surf Interf Anal 41(2009) 653, DOI 10.1002/sia.3070
4. High-resolution G-SIMS imaging using a single Bi gun column, F M Green, Felix Kollmer, E Niehuis, I S Gilmore, Rapid Commun. Mass Spectrom. 2008; 22: 2602–2608; DOI: 10.1002/rcm.3648
5. Static SIMS – VAMAS Interlaboratory study for Intensity Repeatability, Mass Scale Accuracy and Relative Quantification, F M Green, J L S Lee, I S Gilmore, S J Spencer and M P Seah, Surf Interf Anal, 42 (2010) 129.
6. Surface Analysis: The Principal Techniques, 2nd Edition, Eds J C Vickerman and I S Gilmore, Wiley (ISBN: 978-0-470-01763-0)
7. Multivariate Analysis in Surface Analysis, Surface and Interface Analysis, Eds I S Gilmore and M S Wagner, 41 (2009) Issues 2 & 8.

Contact details

E-mail: ian.gilmore@npl.co.uk
Tel: 020 8943 6922