Surface chemical analytical techniques are key to understanding and characterising surfaces from the microscale to the nanoscale. This is central to the correct operation and novel properties of many products and devices.
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Surface + Nanoanalysis
Surface and nanoanalysis are essential tools for today’s high technology and innovative industries. Interactions of surfaces with the surrounding environment are key to durability, compatibility and enhanced product quality.
At NPL, our research is focused on innovation, trade, industrial competitiveness and quality of life. Markets where surface and nanoanalysis is important include aerospace, chemicals, pharmaceuticals, health, personal care, packaging, electronics, IT equipment, polymers, sensors and transport.
NPL aims to meet industry’s needs in developing measurement infrastructure to analyse materials at surfaces to the single atomic layer level, with optimal spatial resolution and optimal valid information.
For more information please contact: nanoanalysis@npl.co.uk
Surface and Nanoanalysis research
- Scanning Probe Microscopy is a class of measurement methods for imaging surfaces by mechanically scanning a probe over the surface under study. It is a generic term that encompasses a wide number of techniques including AFM, SNOM, STM, etc.
- MEMS (Micro-Electromechanical Systems) play a crucial role in nanoscale measurement.
Surface and Nanoanalysis products & services
- NPL has developed a number of reference materials for quantitative chemical analysis of surfaces and depth profiling. A list of frequently asked questions can be found here. For more information on these materials, please contact nanoanalysis@npl.co.uk.
- The Surface Chemical Analysis Standard Data Transfer Format, developed by various users and manufacturers in the VAMAS community, allows data from any system to be read by any compatible software to allow quantitative surface analysis.
- A new general, predictive semi-empirical equation for the sputtering yields of monoatomic elemental solids, using 250 eV to 10000 eV ions incident normally on the surface, has been developed valid for Ne, Ar and Xe ions.
- NPL has developed software for intensity calibration of cylindrical mirror analyser (CMA) or hemispherical sector analyser (HSA) spectrometers. With spectra acquired from copper, silver and gold reference materials, the software can be used to calculate the intensity response function (or transmission function) of the spectrometer.
- Multivariate analysis is very powerful in the analysis of SIMS images. Here we provide a basic tutorial in the use of chemometrics, in particular multivariate analysis, and its application to the interpretation of static SIMS spectra and images.
- EasyGSIMS is a simple Excel spreadsheet allowing simple interpretation of SIMS data through analysis using the GSIMS method. Just take two sets of spectra at low and high fragmentation conditions, input peak intensities into the spreadsheet and obtain simple GSIMS spectra relating directly to the parent molecules.
- This page gives tables and plots for the Average Matrix Relative Sensitivity Factors (AMRSFs) calculated for Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS).
- NPL provides synthetic XPS data in ISO14976 format files which allow you to validate the peak fitting routines used in your software.
Surface and Nanoanalysis standards
- The development of international standards is an essential component of the work of the Surface and Nanoanalysis Team.
- The Surface and Nanoanalysis Team at NPL have run many major interlaboratory comparisons and pilot studies. A list is shown below.
Surface and Nanoanalysis case studies
NPL’s nanoanalysis team of scientists have broadened the understanding of controlled release drug systems by constructing layered organic films.