Signal Processing Awareness Seminar - November 2005
Developing Good Practice in Metrology Applications
30th November 2005 - NPL
The purpose of the seminar was to invite feedback from those attending on their concerns about the use of Digital Signal Processing in metrology. This was to help determine the contents of our forthcoming Good Practice Guide. The day included technical presentations and software demonstrations; it ended with a panel discussion where the audience could present questions.
Scope
Signal conditioning and processing, both analogue and digital, are ubiquitous in modern metrology. However, it is not always clear what contribution to measurement uncertainty arises from the signal processing methods and algorithms that we employ. The current Software Support for Metrology programme is producing a Good Practice Guide on signal processing for metrologists. As part of this process, individuals were invited to attend a one-day seminar to hear how NPL and industry tackle a range of important measurement problems that incorporate signal processing challenges, and contribute their own experiences.
