21 Apr 2010 : Computational Science in Metrology (CSIM)

Description:

This meeting aims to bring together measurement scientists, manufacturing engineers, quality professionals and statisticians from backgrounds such as the manufacturing, testing, design, and academia, with a common interest in research, development and applications in areas related to mathematics and computing in metrology.

It will be an opportunity to discuss the latest developments in the Software Support for Metrology programme, covering topics such as:

• Bayesian methods
• Molecular and multiscale modelling
• The GUM and its revision (with a round table discussion)

There will be an associated poster exhibition presenting applications of computational science to metrology. Please contact Nancy Moore if you are interested in presenting a poster.

There will also be a drinks reception on 20 April 2010 to celebrate a decade of the Software Support for Metrology programme.

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