National Physical Laboratory

CIM 2017

Date:
19 September 2017 - 21 September 2017
Description:

CIM 2017, International Metrology Congress, will be held, from 19 to 21 September in Paris (France).

The CIM is a unique crossroads between R&D and industrial applications for: industrial end-users of measurement equipment; technical experts; public and private laboratories; manufacturers and service providers.

The event is particularly focusing on 'Measure and Create the Future' and addresses measurement topics in three directions: processes, techniques and prospects.

The Congress focuses on improving your measurement, analysis and test processes, whilst reducing any inherent risks; and exploring evolutions in techniques, R&D progress and learning more about practical industrial applications.

The major topics are:

  • Metrology 4.0 and factory of the future
  • New ISO 17 025
  • Metrology for biology, health and pharmaceutics
  • New developments in energy and nanotechnologies

There are six industrial round-table sessions, 180 presentations, technical visits, a metrology village, poster session and numerous opportunities to network.

The CIM 2017 is co-organised with ENOVA Paris, the reference exhibition for technologies in Electronic, IoT, Measurement, Vision and Optic.

Venue:

Porte de Versailles Exhibition Hall
1 place de la Porte de Versailles
75015 Paris, France

Cost:

Various - see details

Registration:

Register online

Contact:

info@cfmetrologie.com

Web:

See event website

Registration

Please note that the information will not be divulged to third parties, or used without your permission

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