National Physical Laboratory

International Congress of Metrology

Date:
07 October 2013 - 10 October 2013
Description:

This three day conference in the heart of Paris offers the opportunity to understand the latest technical developments in measurement, explore industrial challenges and develop solutions that will enhance innovation and performance through a varied conference programme, an exhibition and technical site visits.

The programme includes round-tables on the following subjects:

  • Metrology challenges for nanotechnologies
  • The metrological requirements specific to high-tech trades (automotive, aerospace, medical)
  • Medical Biology and accreditation
  • The importance of metrology in food processing
  • Risk management in assessing the product conformity
  • How measurement supports the development of low carbon technologies

The Congress programme is based on the following themes:

  • Control of measurement, analysis and testing processes: uncertainty, traceability, verification, training, certification, modelling and numerical methods, metrology function
  • Physical and chemical measurements: mass, force, pressure, dimensional, temperature, optics
  • Regulation, legal metrology and international recognition
  • Metrology in new sectors: biotechnology, environment, sensory measurement, sensors and smart grid

The only event of this scale in Europe, the International Metrology Congress is organised by the Collège Français de Métrologie in partnership with Euramet, BIPM, OIML, the NCSLI and NPL for the international level and EDF, GSK Biologicals, Peugeot Citroën Automobiles, Acac, BEA Métrologie, Cetiat, IMQ, Belgian Laboratory of Metrology, LNE, Hexagon Metrology, Trescal and INSA Lyon.

(The call for papers expired on 20 December 2012.)

Venue:

1 place de la Porte de Versailles, 75015 Paris

Cost:

See www.metrologie2013.com

Registration:

See www.metrologie2013.com

Contact:

E: info@cfmetrologie.com
T: +33 (0) 467 062 036

Web:

www.metrologie2013.com