National Physical Laboratory

Generating Robust and Relevant Data for Tribological Performance (Webinar)

Date:
30 May 2013
Description:

Control of wear and friction is an important issue that affects the industry and society, ranging from slipping on an icy surface to determining the functionality and durability of components that are subjected to harsh wear environments. There is a growing need to generate reliable and robust tribological data that is relevant to such complex engineering applications. This webinar discusses the issues that must be addressed to meet this need, which include:

  • Why do we want to carry out tribological tests?
  • Factors governing selection of tests
  • Ensuring relevance to applications
  • Different types of wear
  • Measurements in tribology
  • Factors in practical simulation
  • Summary of surface examination techniques
  • Summary of approach to wear testing

The talk will also describe the progress that is being made to improve the metrology of wear testing through a project funded by the European Metrology Research Project (EMRP) for the assessment of the durability of engineered surfaces.

Who should attend?
Material scientists, surface engineers and designers developing and implementing complex engineering solutions.

Speaker profile:
Mark Gee is a NPL Fellow in the Materials Division at NPL. Recently, he was awarded the status of visiting Professor at the University of Southampton and is a core member of the national Centre for Advanced Tribology at Southampton (nCATS). He has published over 200 papers and reports. He has recently been Chairman of the Institute of Physics Tribology Group, and is now Secretary of the Surface Engineering Division of the Institute of Materials, Mining and Minerals. He is also a member of the International Advisory Editorial Boards of Tribology International, and Tribology - Materials Surfaces and Interfaces. He is a member of various standards committees including ASTM Committee G2 on Wear, ISO TC 206 Advanced Ceramics, BS NTI/1 Nanotechnology, and ISO TC 229 Nanotechnologies where he led a project that recently published the first international standard on nanotechnologies.

Venue:

Online (1200 - 1300 hrs) - to participate, you will need a phone line and Internet access

Cost:

Free to attend, but registration is essential

Registration:

Register online

Contact:

events@npl.co.uk

Web:

This event is organised by Measurement Network and the IET

Measurement Network
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