Raman spectroscopy is a well-known powerful analytical tool in structural/chemical analysis on the micrometer scale. Tip-Enhanced Raman Spectroscopy (TERS) is an emerging approach that aids localised measurements down to a scale of few tens of nanometre. TERS can change the course of characterisation at the nanoscale.

Aiming to push the boundaries of frontier research on nanoscale structures and properties, NPL invites you to submit an oral/poster presentation for the TERS III event.

Who should attend

• Industrial researchers in pharmaceuticals, biotechnology, polymer electronics, micro and nanotechnology and aerospace
• Academic researchers, students and post-doctoral researchers
• Instrument manufacturers in TERS, AFM, Raman and other nanotechnology tools

Opportunities and benefits

• Presentations by world renowned scientists and technologists
• Networking with key researchers
• Discussions on impact of TERS on measurement and characterisation
• Opportunities for collaboration in grant funded research
• Instrument demonstrations

Abstract submission deadline: 19 July 2013

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