Nanodimensional
Recent advances in precision engineering, optics, electronics, materials technology and molecular biology have placed increasing demands on nanometrology - the measurement of dimensions or tolerances below 1 µm. To cater for this demand NPL is currently engaged in research to improve metrology at the nano metre level which builds on a number of instruments previously developed at NPL which were designed for measuring surface texture and form with traceability to the metre.
Nanodimensional research
- NPL is leading the way for areal surface topography measurement with good practice guides, instrumentation and artefacts to transfer traceability of measurements to industry.
- Research to improve dimensional metrology using AFMs.
- NPL is involved in a EU Framework 7 funded support action to address the need within Europe to develop the required measurement framework to successfully support the development and economic exploitation of nanotechnology.
- NPL is working to develop a complete route to nanonewton force traceability.
- NPL is developing a traceable thin film thickness measurement capability.
- NPL is supporting industry by providing measurement solutions to underpin the manufacture of advanced MEMS sensors.
- NPL is developing probes and probing strategies for use with small-scale or micro co-ordinate measuring machines (CMMs).
- NPL led a EU funded project with the Physikalisch-Technische Bundesanstalt and Istituto Nazionale di Ricerca Metrologica to develop a Combined Optical and X-ray Interferometer for the sub-nanometre calibration of displacement measuring transducers.
Nanodimensional products & services
- Software measurement standards.
- NPL and BSI produce good practice guidance on the use of surface topography measurement instrumentation.
- In January 2011 NPL's nanometrology experts published a review paper on nanometrology, written with European collaborators.
- NPL provides a one-stop service for the characterisation of the form and texture of surfaces through our extensive range of facilities.
- Measurement service for Atomic Force Microscopy.
- Measurement service for surface texture.