Research
Research
- NPL is leading the way for areal surface topography measurement with good practice guides, instrumentation and artefacts to transfer traceability of measurements to industry.
- Research to improve dimensional metrology using AFMs.
- NPL is involved in a EU Framework 7 funded support action to address the need within Europe to develop the required measurement framework to successfully support the development and economic exploitation of nanotechnology.
- NPL is working to develop a complete route to nanonewton force traceability.
- NPL is developing a traceable thin film thickness measurement capability.
- NPL is supporting industry by providing measurement solutions to underpin the manufacture of advanced MEMS sensors.
- NPL is developing probes and probing strategies for use with small-scale or micro co-ordinate measuring machines (CMMs).
- NPL led a EU funded project with the Physikalisch-Technische Bundesanstalt and Istituto Nazionale di Ricerca Metrologica to develop a Combined Optical and X-ray Interferometer for the sub-nanometre calibration of displacement measuring transducers.





