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Surface Topography

NPL provides services for the characterisation of the form and texture of micro or nano-scale surface features using our extensive range of facilities. NPL designed instruments, such as the Areal Instrument (for 3-dimensional surface paramaters), Metrological Atomic Force Microscope (MAFM) and NanoSurf IV, provide the highest level of accuracy and direct traceability to the metre. In addition to these unique capabilities an extensive range of commercial instruments including a stylus instruments and non-contacting instruments (scanning white light interferometer, variable focus and confocal microscopes), are available. 

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Contact

Customer Service tel: +44 20 8943 8631
E-mail: dimensional_enquiries@npl.co.uk

Last Updated: 2 Aug 2010
Created: 2 Aug 2010