NPL leads five EMRP New Technologies projects and is a partner in a further three. These projects aim to support new scientific and technical developments with a suitable measurement infrastructure, stimulate technological innovation and improve the data needed for policy making and regulation. The focus of the projects is on nanotechnology, new materials, biotechnology, mathematics and ICT metrology.
NPL led projects
Traceable characterisation of nanostructured devices
A revolution is occurring in the world of micro- and nano-electronics in terms of miniaturisation, power consumption and processing speed. New types of inorganic materials are being used in semiconductor materials, where silicon has always dominated, new 3D architectures are being employed in chip design and new electronics based on organic semiconductors are emerging.
The techniques used in the semiconductor industry need to be updated to ensure that they apply to these new technologies. This project will support this by developing and improving the methods for characterising the chemical and electrical properties of nanostructures.
No single technique can provide the traceability required, therefore this project will make accurate comparisons between a range of different techniques. By ensuring accurate measurement and reliable characterisation of material and device properties, this project will support the competitiveness of the European semiconductor industry.
Metrology for Raman spectroscopy
Raman spectroscopy is a technique that uses scattered light to identify and map the distribution of chemicals and structures at the micro- or nanoscale. It is used by the pharmaceutical, healthcare, biotechnology, nanotechnology and forensic science sectors and is a fast and non-destructive method. However, Raman spectroscopy is relatively new to measurement science and is not currently accepted by regulatory bodies for the approval of drugs, as the data it provides is not yet traceable.
This project will address the regulatory needs of Raman spectroscopy, by improving measurement reliability, establishing traceability to the SI Units mole and metre, and by developing reference samples. It will also provide measurement standards for spatial resolution, depth resolution and confocality; a specific request from device manufacturers.
The results of the project will improve the use of Raman spectroscopy for high resolution chemical and structural identification, with applications in experimental science, industry and healthcare.
Contact: Alistair Forbes
Traceability for computationally-intensive metrology
Information and Computing Technology (ICT) dominates all aspects of business and much of our daily lives, and plays a large role in many areas of measurement. Traceability, measurement standards and quality systems all demand the demonstration of computational links that are fit for purpose, but testing is difficult without knowing whether software is producing accurate results in the first place.
This project will use mathematics, numerical analysis and state of the art computer technology to validate software and develop new technologies to deliver traceability to measurements requiring intensive computing. It will ensure the trustworthiness and fitness for purpose of measurement software and enhance consumer confidence in metrology products.
Internet based services will be used to validate software at the point of use and industrial partners, Hexagon, Mitutoyo, Werth and Zeiss, will deliver the new systems to thousands of users, changing the traceability landscape for computation in coordinate metrology.
Metrology with/for NEMS
Industry demands increasing complexity, speed and performance from devices, as well as a reduction in size. Nano-electro-mechanical systems (NEMS) devices integrate electrical or mechanical functionality at the nanoscale level and are a key disruptive technology that could potentially provide solutions to a range of technological barriers, from electronics and computing, to physical and biological sensors.
As the dimensions of devices are reduced, new technologies and approaches are needed, however NEMS has not yet been exploited to meet these needs.
This project will develop precise and traceable measurements of physical parameters such as mass, force, displacement and temperature, as well as single photon and single molecule measurement, at the nanoscale level. It will also investigate new materials such as graphene and piezoelectrics to develop high performance NEMS.
Metrology of electro-thermal coupling for new functional materials technology
The automotive, energy, and medical industries all require high temperature functional materials to increase efficiency. New solid-state cooling techniques are currently being developed for computer chips and for domestic refrigeration using electrocaloric materials, however these are not yet supported by reliable measurements.
This project will develop reliable, accurate and traceable measurements of electro-thermal-mechanical coupling at high temperatures in order to support new functional material technologies, such as electrocaloric materials and the products that use them.
The project will lead to the development of new technologies for more efficient and reliable transport and power generation, for example, through piezoelectric control of fuel flow in aero-engines and high temperature sensing and integrity monitoring in steam facilities. It will also enable new solid state cooling technologies to reduce greenhouse gas emissions from refrigeration and enable faster electronics thorough on-chip thermal management.