National Physical Laboratory

Advances in large-scale metrology - review and future trends.

Author(s):
Schmitt, R H*, Peterek, M*, Morse, E*, Knapp, W*, Hartig, F*, Goch, G*, Hughes, B, Forbes, A B, Estler, W T*
Source:
CIRP Ann. - Manuf. Technol., 2016, 65, (2), 643-665
ISSN:
ISBN:
NPL Doc. Ref:
PDB: 8209 | DDB: 8028
Document Type:
Periodical article
DOI:
http://dx.doi.org/10.1016/j,cirp.2016.05.002

Note: An asterisk after an author's name indicates a non-NPL author.

Abstract:

The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology

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