Terahertz calibration and test artefacts
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NPL can supply a range of calibration and test artefacts including: gas cells for frequency calibration; etalons for frequency calibration; amplitude/power linearity test kits; masks for image resolution tests.
NPL has worked extensively with academic and industrial partners and other National Measurement Institutes on terahertz research, developing THz metrology techniques and good practice guidelines. We are able to offer a range of consultancy and training services, as well as test and calibration of THz systems, sources and detectors.
We have developed reference and calibration standards for frequency, amplitude/power linearity, and image resolution, which are available for purchase.
We can supply calibration and test artefacts:
Gas cells for frequency calibration: sealed cells with PTFE windows, filled with carbon monoxide gas; available in a range of sizes
Uniformly spaced peaks in the range 0.5-2.5 THz, at 114 GHz intervals
High frequency resolution (<1 GHz)
Variable peak intensity
Etalons for frequency calibration
Uniformly-spaced peaks and troughs covering the whole of the available THz band
Frequency spacing as required
Low frequency resolution (~5 GHz)
Well-defined, uniform spectral profile
Small, light and convenient to use
Amplitude/power linearity test kits
Compact and easy to use
Dynamic range as required, determined by the number of plates
Particularly suited for time-domain spectrometers
Can be used with other types of THz systems
Masks for image resolution tests – two types are available
Square masks for instruments that employ raster scanning: features of 120-1200 mm
Circular masks for instruments that employ spiral scanning: features of 50-800 µm
Gas cells for frequency calibration
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Amplitude/power linearity test kit
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