NanoVision is NPL’s nanometric linescale imaging system, which offers sub-pixel positional accuracy for linescale, crosses orientated at 0° & 45°, and for many other targets often measured using high specification linear linescale comparators or CMM type measuring systems.

NPL’s NanoVison is now being used in UK, Belgium, Sweden and Ireland

NanoVision is NPL’s nanometric linescale imaging system, which offers sub-pixel positional accuracy for scale-lines, crosses orientated at 0° & 45°, and for many other targets often measured using high specification linear linescale comparators or CMM type measuring systems. NanoVision is a PC/Camera based image analyser specifically designed for high precision optical metrology applications and dependant on the options acquired, can be used manually, semi or under full-automatic remote control via IEEE interface. Nanovision is designed to be integrated with ‘standards-quality’ measuring systems that employ good quality optics and positioning encoders/interferometers.

NanoVision significantly improves setting capabilities for line and cross type features, removing reliance on human eye judgment and eye-strain issues. NanoVision can position features on a large variety of industrial and standards type scales.

NanoVision is very flexible and can be interfaced with measuring machines in many ways (dependent on host linescale machine, CMM.etc..) allowing the high precision position-centering of targets.  NanoVision may be configured in a number of ways - Visually by eye; Visually reading numbers; Audibly; Semi-automatically; Fully-automatic.

NanoVision base unit: